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Optical-Based Thickness Measurement of MoO3 Nanosheets.
Puebla, Sergio; Mariscal-Jiménez, Antonio; Galán, Rosalía Serna; Munuera, Carmen; Castellanos-Gomez, Andres.
Affiliation
  • Puebla S; Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), E-28049 Madrid, Spain.
  • Mariscal-Jiménez A; Laser Processing Group, Instituto de Óptica (IO, CSIC), Serrano 121, 28006 Madrid, Spain.
  • Galán RS; Laser Processing Group, Instituto de Óptica (IO, CSIC), Serrano 121, 28006 Madrid, Spain.
  • Munuera C; Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), E-28049 Madrid, Spain.
  • Castellanos-Gomez A; Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), E-28049 Madrid, Spain.
Nanomaterials (Basel) ; 10(7)2020 Jun 29.
Article in En | MEDLINE | ID: mdl-32610559
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanomaterials (Basel) Year: 2020 Document type: Article Affiliation country: Spain Country of publication: Switzerland
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanomaterials (Basel) Year: 2020 Document type: Article Affiliation country: Spain Country of publication: Switzerland