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Nanoscale crystal grain characterization via linear polarization X-ray ptychography.
Gao, Zirui; Holler, Mirko; Odstrcil, Michal; Menzel, Andreas; Guizar-Sicairos, Manuel; Ihli, Johannes.
Affiliation
  • Gao Z; Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. manuel.guizar-sicairos@psi.ch johannes.Ihli@psi.ch and ETH Zurich, Department of Information Technology and Electrical Engineering, 8093 Zurich, Switzerland.
  • Holler M; Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. manuel.guizar-sicairos@psi.ch johannes.Ihli@psi.ch.
  • Odstrcil M; Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. manuel.guizar-sicairos@psi.ch johannes.Ihli@psi.ch.
  • Menzel A; Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. manuel.guizar-sicairos@psi.ch johannes.Ihli@psi.ch.
  • Guizar-Sicairos M; Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. manuel.guizar-sicairos@psi.ch johannes.Ihli@psi.ch.
  • Ihli J; Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. manuel.guizar-sicairos@psi.ch johannes.Ihli@psi.ch.
Chem Commun (Camb) ; 56(87): 13373-13376, 2020 Nov 03.
Article in En | MEDLINE | ID: mdl-33030473

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Nanoparticles / Microscopy Language: En Journal: Chem Commun (Camb) Journal subject: QUIMICA Year: 2020 Document type: Article Affiliation country: Switzerland Country of publication: United kingdom

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Nanoparticles / Microscopy Language: En Journal: Chem Commun (Camb) Journal subject: QUIMICA Year: 2020 Document type: Article Affiliation country: Switzerland Country of publication: United kingdom