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Role of defects and grain boundaries in the thermal response of wafer-scale hBN films.
Bera, K; Roy, Anushree; Chugh, D; Wong-Leung, J; Hoe Tan, H; Jagadish, C.
Affiliation
  • Bera K; School of Nano Science and Technology, Indian Institute of Technology Kharagpur. Pin 721302. India.
  • Roy A; Department of Physics, Indian Institute of Technology Kharagpur. Pin 721302. India.
  • Chugh D; Department of Electronic Materials Engineering, Research School of Physics, The Australian National University, Canberra, ACT 2601, Australia.
  • Wong-Leung J; Department of Electronic Materials Engineering, Research School of Physics, The Australian National University, Canberra, ACT 2601, Australia.
  • Hoe Tan H; Department of Electronic Materials Engineering, Research School of Physics, The Australian National University, Canberra, ACT 2601, Australia.
  • Jagadish C; Australian Research Council Centre of Excellence for Transformative Meta-Optical Systems, Research School of Physics, The Australian National University, Canberra, ACT 2601, Australia.
Nanotechnology ; 32(7): 075702, 2021 Feb 12.
Article in En | MEDLINE | ID: mdl-33075756
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanotechnology Year: 2021 Document type: Article Country of publication: United kingdom
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanotechnology Year: 2021 Document type: Article Country of publication: United kingdom