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Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene.
Reed, Benjamen P; Cant, David J H; Spencer, Steve J; Carmona-Carmona, Abraham Jorge; Bushell, Adam; Herrera-Gómez, Alberto; Kurokawa, Akira; Thissen, Andreas; Thomas, Andrew G; Britton, Andrew J; Bernasik, Andrzej; Fuchs, Anne; Baddorf, Arthur P; Bock, Bernd; Theilacker, Bill; Cheng, Bin; Castner, David G; Morgan, David J; Valley, David; Willneff, Elizabeth A; Smith, Emily F; Nolot, Emmanuel; Xie, Fangyan; Zorn, Gilad; Smith, Graham C; Yasufuku, Hideyuki; Fenton, Jeffery L; Chen, Jian; Counsell, Jonathan D P; Radnik, Jörg; Gaskell, Karen J; Artyushkova, Kateryna; Yang, Li; Zhang, Lulu; Eguchi, Makiho; Walker, Marc; Hajdyla, Mariusz; Marzec, Mateusz M; Linford, Matthew R; Kubota, Naoyoshi; Cortazar-Martínez, Orlando; Dietrich, Paul; Satoh, Riki; Schroeder, Sven L M; Avval, Tahereh G; Nagatomi, Takaharu; Fernandez, Vincent; Lake, Wayne; Azuma, Yasushi; Yoshikawa, Yusuke.
Affiliation
  • Reed BP; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom.
  • Cant DJH; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom.
  • Spencer SJ; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom.
  • Carmona-Carmona AJ; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico.
  • Bushell A; Thermo Fisher Scientific (Surface Analysis), East Grinstead RH19 1XZ, United Kingdom.
  • Herrera-Gómez A; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico.
  • Kurokawa A; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan.
  • Thissen A; SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany.
  • Thomas AG; School of Materials, Photon Science Institute and Sir Henry Royce Institute, Alan Turing Building, University of Manchester, Oxford Road, Manchester M13 9PL, United Kingdom.
  • Britton AJ; Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom.
  • Bernasik A; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland.
  • Fuchs A; Robert Bosch GmbH, Robert-Bosch-Campus, 71272 Renningen, Germany.
  • Baddorf AP; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830.
  • Bock B; Tascon GmbH, Mendelstr. 17, D-48149 Münster, Germany.
  • Theilacker B; Medtronic, 710 Medtronic Parkway, LT240, Fridley, Minnesota 55432.
  • Cheng B; Analysis and Testing Center, Beijing University of Chemical Technology, Beijing 100029, People's Republic of China.
  • Castner DG; National ESCA and Surface Analysis Center for Biomedical Problems, Department of Bioengineering and Chemical Engineering, University of Washington, Seattle, Washington 98195.
  • Morgan DJ; Cardiff Catalysis Institute, School of Chemistry, Cardiff University, Main Building, Cardiff CF10 3AT, United Kingdom.
  • Valley D; Physical Electronics Inc., East Chanhassen, Minnesota 55317.
  • Willneff EA; Versatile X-ray Spectroscopy Facility, School of Design, University of Leeds, Leeds LS2 9JT, United Kingdom.
  • Smith EF; Nanoscale and Microscale Research Centre, University of Nottingham, Nottingham NG7 2RD, United Kingdom.
  • Nolot E; CEA-LETI, 17 rue des Martyrs, 38054 Grenoble, France.
  • Xie F; Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People's Republic of China.
  • Zorn G; GE Research, 1 Research Circle, K1 1D7A, Niskayuna, New York 12309.
  • Smith GC; Faculty of Science and Engineering, University of Chester, Thornton Science Park, Chester CH2 4NU, United Kingdom.
  • Yasufuku H; Materials Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0044, Japan.
  • Fenton JL; Medtronic, 6700 Shingle Creek Parkway, Brooklyn Center, Minnesota 55430.
  • Chen J; Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People's Republic of China.
  • Counsell JDP; Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, United Kingdom.
  • Radnik J; Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany.
  • Gaskell KJ; Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20742.
  • Artyushkova K; Physical Electronics Inc., East Chanhassen, Minnesota 55317.
  • Yang L; Department of Chemistry, Xi'an Jiaotong-Liverpool University, 111 Ren'ai Road, Suzhou Dushu Lake Science and Education Innovation District, Suzhou Industrial Park, Suzhou 215123, People's Republic of China.
  • Zhang L; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan.
  • Eguchi M; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan.
  • Walker M; Department of Physics, University of Warwick, Coventry, West Midlands CV4 7AL, United Kingdom.
  • Hajdyla M; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland.
  • Marzec MM; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland.
  • Linford MR; Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602.
  • Kubota N; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan.
  • Cortazar-Martínez O; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico.
  • Dietrich P; SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany.
  • Satoh R; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan.
  • Schroeder SLM; Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom.
  • Avval TG; Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602.
  • Nagatomi T; Platform Laboratory for Science and Technology, Asahi Kasei Corporation, 2-1 Samejima, Fuji, Shizuoka 416-8501, Japan.
  • Fernandez V; Université de Nantes, CNRS, Institut des Matériaux Jean Rouxel, IMN, F-44000 Nantes, France.
  • Lake W; Atomic Weapons Establishment (AWE), Aldermaston, Reading, Berkshire RG7 4PR, United Kingdom.
  • Azuma Y; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan.
  • Yoshikawa Y; Material Analysis Department, Yazaki Research and Technology Center, Yazaki Corporation, 1500 Mishuku, Susono-city, Shizuoka 410-1194, Japan.
J Vac Sci Technol A ; 38(6): 063208, 2020 Dec.
Article in En | MEDLINE | ID: mdl-33281279
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: J Vac Sci Technol A Year: 2020 Document type: Article Affiliation country: United kingdom Country of publication: United States
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: J Vac Sci Technol A Year: 2020 Document type: Article Affiliation country: United kingdom Country of publication: United States