Leakage Current Analysis Method for Metal Insulator Semiconductor Capacitors Through Low-Frequency Noise Measurement.

Kim, Hyojung; Park, Jongwoo; Kim, Junehwan; Lee, Nara; Lee, Gaeun; Kim, Soonkon; Choi, Pyungho; Beak, Dohyun; Song, Jangkun; Choi, Byoungdeog

Kim, Hyojung; Park, Jongwoo; Kim, Junehwan; Lee, Nara; Lee, Gaeun; Kim, Soonkon; Choi, Pyungho; Beak, Dohyun; Song, Jangkun; Choi, Byoungdeog.

Affiliation

Kim H; Organic Light Emitting Diode Business Samsung Display Co., Ltd., Asan, 31454, Republic of Korea.
Park J; Organic Light Emitting Diode Business Samsung Display Co., Ltd., Asan, 31454, Republic of Korea.
Kim J; Organic Light Emitting Diode Business Samsung Display Co., Ltd., Asan, 31454, Republic of Korea.
Lee N; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea.
Lee G; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea.
Kim S; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea.
Choi P; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea.
Beak D; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea.
Song J; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea.
Choi B; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea.

J Nanosci Nanotechnol ; 21(3): 1966-1970, 2021 Mar 01.

Article in En | MEDLINE | ID: mdl-33404477

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: J Nanosci Nanotechnol Year: 2021 Document type: Article Country of publication: United States

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