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Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy.
Chang, Yun-Yeong; Han, Heung Nam; Kim, Miyoung.
Affiliation
  • Chang YY; Department of Materials Science and Engineering, Seoul National University, Seoul, 151-744, Korea.
  • Han HN; Department of Materials Science and Engineering, Seoul National University, Seoul, 151-744, Korea.
  • Kim M; Department of Materials Science and Engineering, Seoul National University, Seoul, 151-744, Korea. mkim@snu.ac.kr.
Appl Microsc ; 49(1): 10, 2019 Nov 04.
Article in En | MEDLINE | ID: mdl-33580317
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Appl Microsc Year: 2019 Document type: Article Country of publication:
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Appl Microsc Year: 2019 Document type: Article Country of publication: