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A skin-conformable wireless sensor to objectively quantify symptoms of pruritus.
Chun, Keum San; Kang, Youn J; Lee, Jong Yoon; Nguyen, Morgan; Lee, Brad; Lee, Rachel; Jo, Han Heul; Allen, Emily; Chen, Hope; Kim, Jungwoo; Yu, Lian; Ni, Xiaoyue; Lee, KunHyuck; Jeong, Hyoyoung; Lee, JooHee; Park, Yoonseok; Chung, Ha Uk; Li, Alvin W; Lio, Peter A; Yang, Albert F; Fishbein, Anna B; Paller, Amy S; Rogers, John A; Xu, Shuai.
Affiliation
  • Chun KS; Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX 78712, USA.
  • Kang YJ; Querrey Simpson Institute for Bioelectronics, Northwestern University, Evanston, IL 60208, USA.
  • Lee JY; Center for Bio-Integrated Electronics, Northwestern University, Evanston, IL 60208, USA.
  • Nguyen M; Querrey Simpson Institute for Bioelectronics, Northwestern University, Evanston, IL 60208, USA.
  • Lee B; Sibel Health, Niles, IL 60714, USA.
  • Lee R; Northwestern University Feinberg School of Medicine, Chicago, IL 60611, USA.
  • Jo HH; Northwestern University Feinberg School of Medicine, Chicago, IL 60611, USA.
  • Allen E; Sibel Health, Niles, IL 60714, USA.
  • Chen H; Sibel Health, Niles, IL 60714, USA.
  • Kim J; Department of Dermatology, Northwestern University Feinberg School of Medicine, Chicago, IL 60611, USA.
  • Yu L; Center for Bio-Integrated Electronics, Northwestern University, Evanston, IL 60208, USA.
  • Ni X; Sibel Health, Niles, IL 60714, USA.
  • Lee K; Electrical and Computer Engineering, University of Illinois at Champaign-Urbana, Champaign, IL 61801, USA.
  • Jeong H; Querrey Simpson Institute for Bioelectronics, Northwestern University, Evanston, IL 60208, USA.
  • Lee J; Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC 27708, USA.
  • Park Y; Querrey Simpson Institute for Bioelectronics, Northwestern University, Evanston, IL 60208, USA.
  • Chung HU; Center for Bio-Integrated Electronics, Northwestern University, Evanston, IL 60208, USA.
  • Li AW; Querrey Simpson Institute for Bioelectronics, Northwestern University, Evanston, IL 60208, USA.
  • Lio PA; Center for Bio-Integrated Electronics, Northwestern University, Evanston, IL 60208, USA.
  • Yang AF; Sibel Health, Niles, IL 60714, USA.
  • Fishbein AB; Querrey Simpson Institute for Bioelectronics, Northwestern University, Evanston, IL 60208, USA.
  • Paller AS; Center for Bio-Integrated Electronics, Northwestern University, Evanston, IL 60208, USA.
  • Rogers JA; Querrey Simpson Institute for Bioelectronics, Northwestern University, Evanston, IL 60208, USA.
  • Xu S; Center for Bio-Integrated Electronics, Northwestern University, Evanston, IL 60208, USA.
Sci Adv ; 7(18)2021 04.
Article in En | MEDLINE | ID: mdl-33931455
ABSTRACT
Itch is a common clinical symptom and major driver of disease-related morbidity across a wide range of medical conditions. A substantial unmet need is for objective, accurate measurements of itch. In this article, we present a noninvasive technology to objectively quantify scratching behavior via a soft, flexible, and wireless sensor that captures the acousto-mechanic signatures of scratching from the dorsum of the hand. A machine learning algorithm validated on data collected from healthy subjects (n = 10) indicates excellent performance relative to smartwatch-based approaches. Clinical validation in a cohort of predominately pediatric patients (n = 11) with moderate to severe atopic dermatitis included 46 sleep-nights totaling 378.4 hours. The data indicate an accuracy of 99.0% (84.3% sensitivity, 99.3% specificity) against visual observation. This work suggests broad capabilities relevant to applications ranging from assessing the efficacy of drugs for conditions that cause itch to monitoring disease severity and treatment response.

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Diagnostic_studies Language: En Journal: Sci Adv Year: 2021 Document type: Article Affiliation country: United States

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Diagnostic_studies Language: En Journal: Sci Adv Year: 2021 Document type: Article Affiliation country: United States
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