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Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes.
Kirpal, Dominik; Qiu, Jinglan; Pürckhauer, Korbinian; Weymouth, Alfred J; Metz, Michael; Giessibl, Franz J.
Affiliation
  • Kirpal D; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Qiu J; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Pürckhauer K; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Weymouth AJ; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Metz M; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Giessibl FJ; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
Rev Sci Instrum ; 92(4): 043703, 2021 Apr 01.
Article in En | MEDLINE | ID: mdl-34243447
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2021 Document type: Article Affiliation country: Germany Country of publication: United States
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2021 Document type: Article Affiliation country: Germany Country of publication: United States