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Deep-UV Transparent Conducting Oxide La-Doped SrSnO3 with a High Figure of Merit.
Kim, Juhan; Yun, Hwanhui; Seo, Jihoon; Kim, Jae Ha; Kim, Jae Hoon; Mkhoyan, K Andre; Kim, Bongju; Char, Kookrin.
Affiliation
  • Kim J; Institute of Applied Physics, Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea.
  • Yun H; Department of Chemical Engineering and Material Science, University of Minnesota, Minneapolis, Minnesota 55455, United States.
  • Seo J; Institute of Applied Physics, Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea.
  • Kim JH; Department of Physics, Yonsei University, Seoul 03722, Republic of Korea.
  • Kim JH; Department of Physics, Yonsei University, Seoul 03722, Republic of Korea.
  • Mkhoyan KA; Department of Chemical Engineering and Material Science, University of Minnesota, Minneapolis, Minnesota 55455, United States.
  • Kim B; Institute of Applied Physics, Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea.
  • Char K; Institute of Applied Physics, Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea.
ACS Appl Electron Mater ; 4(7): 3623-3631, 2022 Jul 26.
Article in En | MEDLINE | ID: mdl-35937184
ABSTRACT
Perovskite stannate SrSnO3 (SSO) is attracting attention as ultraviolet transparent conducting oxides (UV TCOs) due to its ultrawide band gap and high conductivity. Here, we investigate in detail the thickness-dependent electrical, structural, and optical properties of sequentially strain-relaxed La-doped SrSnO3 (SLSO) epitaxial thin films. We find that the SLSO films grow as an orthorhombic Pnma phase with a - a - c + in the c + direction under the tensile strain. With the strain relaxation, as the films become thicker, vertical grain boundaries are created and the orthorhombic phase becomes reoriented to all three possible orientations. Simultaneously, the conductance starts to deviate from the linear behavior with increasing film thickness. Through the analysis of thickness fringes in optical transmittance, we found that a 120 nm thick nominally 4% La-doped SrSnO3 film has a figure of merit (φTC = 2.65 × 10-3 Ω-1) at λ = 300 nm in the deep-UV region, which is the highest value among the well-known candidates for UV TCOs reported to date.

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Appl Electron Mater Year: 2022 Document type: Article Publication country: EEUU / ESTADOS UNIDOS / ESTADOS UNIDOS DA AMERICA / EUA / UNITED STATES / UNITED STATES OF AMERICA / US / USA

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Appl Electron Mater Year: 2022 Document type: Article Publication country: EEUU / ESTADOS UNIDOS / ESTADOS UNIDOS DA AMERICA / EUA / UNITED STATES / UNITED STATES OF AMERICA / US / USA