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Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy.
Roccapriore, Kevin M; Boebinger, Matthew G; Dyck, Ondrej; Ghosh, Ayana; Unocic, Raymond R; Kalinin, Sergei V; Ziatdinov, Maxim.
Affiliation
  • Roccapriore KM; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831, United States.
  • Boebinger MG; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831, United States.
  • Dyck O; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831, United States.
  • Ghosh A; Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831, United States.
  • Unocic RR; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831, United States.
  • Kalinin SV; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee37916, United States.
  • Ziatdinov M; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831, United States.
ACS Nano ; 16(10): 17116-17127, 2022 Oct 25.
Article in En | MEDLINE | ID: mdl-36206357
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Nano Year: 2022 Document type: Article Affiliation country: United States Country of publication: United States
Fulltext
Add to My VHL
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Nano Year: 2022 Document type: Article Affiliation country: United States Country of publication: United States