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CryoEM Status Update and Innovative Developments.
Lytton-Jean, Abigail K R; Mankus, David V; Bisher, Margaret E.
Affiliation
  • Lytton-Jean AKR; Koch Institute for Integrative Cancer Research, Massachusetts Institute of Technology; aklytton@mit.edu.
  • Mankus DV; Koch Institute for Integrative Cancer Research, Massachusetts Institute of Technology.
  • Bisher ME; Koch Institute for Integrative Cancer Research, Massachusetts Institute of Technology.
J Vis Exp ; (193)2023 03 03.
Article in En | MEDLINE | ID: mdl-37602884
ABSTRACT
ARTICLES DISCUSSED Truong, C. D. et al. Sample preparation using a lipid monolayer method for electron crystallographic studies. Journal of Visualized Experiments. (177), e63015 (2021). Johnson, M. C., Grant, A. J., Schmidt-Krey, I. The peel-blot technique A cryo-EM sample preparation method to separate single layers from multi-layered or concentrated biological samples. Journal of Visualized Experiments. (184), e64099 (2022). Chang, Y.-C., Chen, C.-Y., Tsai, M.-D. Preparation of high-temperature sample grids for cryo-EM. Journal of Visualized Experiments. (173), e62772 (2021). Kang, M.-H., Lee, M., Kang, S., Park, J. Fabrication of micro-patterned chip with controlled thickness for high-throughput cryogenic electron microscopy. Journal of Visualized Experiments. (182), e63739 (2022). Bieber, A., Capitanio, C., Wilfling, F., Plitzko, J., Erdmann, P. S. Sample preparation by 3D-correlative focused ion beam milling for high-resolution cryo-electron tomography. Journal of Visualized Experiments. (176), e62886 (2021). DiCecco, L.-A. et al. Advancing high-resolution imaging of virus assemblies in liquid and ice. Journal of Visualized Experiments. (185), e63856 (2022). Kumar, A., P, S., Gulati, S., Dutta, S. User-friendly, high-throughput, and fully automated data acquisition software for single-particle cryo-electron microscopy. Journal of Visualized Experiments. (173), e62832 (2021).
Subject(s)

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Computer Systems / Cryoelectron Microscopy Language: En Journal: J Vis Exp Year: 2023 Document type: Article

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Computer Systems / Cryoelectron Microscopy Language: En Journal: J Vis Exp Year: 2023 Document type: Article