Atomic-scale Secondary-electron Imaging in the STEM and SEM. | Microsc Microanal;29(Supplement_1): 452-453, 2023 Jul 22. | MEDLINE

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Atomic-scale Secondary-electron Imaging in the STEM and SEM.

Egerton, Ray; Hwang, Sooyeon; Zhu, Yimei.

Affiliation

Egerton R; Physics Department, University of Alberta, Edmonton, Canada.
Hwang S; Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY, United States.
Zhu Y; Electron Microscopy and Nanostructure Group, Condensed Matter Physics and Materials Science Division, Brookhaven National Laboratory, Upton, NY, United States.

Microsc Microanal ; 29(Supplement_1): 452-453, 2023 Jul 22.

Article in En | MEDLINE | ID: mdl-37613030

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2023 Document type: Article Affiliation country: Canada Country of publication: United kingdom

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2023 Document type: Article Affiliation country: Canada Country of publication: United kingdom