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Characterization of High Entropy Oxide Thin Films by High-Resolution STEM-EELS.
Ayyagari, Sai Venkata Gayathri; Miao, Leixin; Webb, Matthew; Heron, John; Alem, Nasim.
Affiliation
  • Ayyagari SVG; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania, United States.
  • Miao L; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania, United States.
  • Webb M; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, United States.
  • Heron J; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, United States.
  • Alem N; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania, United States.
Microsc Microanal ; 29(Supplement_1): 1768-1769, 2023 Jul 22.
Article in En | MEDLINE | ID: mdl-37613938
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2023 Document type: Article Affiliation country: United States
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2023 Document type: Article Affiliation country: United States