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The relationship between ionic-electronic coupling and transport in organic mixed conductors.
Keene, Scott T; Rao, Akshay; Malliaras, George G.
Affiliation
  • Keene ST; Department of Engineering, Electrical Engineering Division, University of Cambridge, Cambridge, CB3 0FA, UK.
  • Rao A; Cavendish Laboratory, Department of Physics, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Malliaras GG; Cavendish Laboratory, Department of Physics, University of Cambridge, Cambridge, CB3 0HE, UK.
Sci Adv ; 9(35): eadi3536, 2023 Sep.
Article in En | MEDLINE | ID: mdl-37647402
Organic mixed ionic-electronic conductors (OMIECs) directly convert between ionic and electronic charge through electrochemical (de)doping, enabling a wide range of applications in bioelectronics, neuromorphic computing, and energy storage and conversion. While both ionic and electronic transport are individually well characterized, their combined transport has been difficult to describe self-consistently. We use in situ measurements of electrochemical (de)doping of an archetypal OMIEC to inform a quasi-field drift-diffusion model, which accurately captures experimentally measured ion transport across a range of potentials. We find that the chemical potential of holes, which is modulated by changes in doping level, represents a major driving force for mixed charge transport. Using numerical simulations at device-relevant time scales and potentials, we find that the competition between hole drift and diffusion leads to diffuse space charge regions despite high charge densities. This effect is unique to mixed conducting systems where mobile ionic charges can compensate the accumulation or depletion of electronic charge, thereby screening electrostatic driving forces.

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sci Adv Year: 2023 Document type: Article Country of publication: United States

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sci Adv Year: 2023 Document type: Article Country of publication: United States