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X-ray free-electron laser induced acoustic microscopy (XFELAM).
Choi, Seongwook; Park, Sinyoung; Kim, Jiwoong; Kim, Hyunhee; Cho, Seonghee; Kim, Sunam; Park, Jaeku; Kim, Chulhong.
Affiliation
  • Choi S; Pohang University of Science and Technology (POSTECH), Medical Device Innovation Center, Department of Electrical Engineering, Convergence IT Engineering, Mechanical Engineering, Medical Science and Engineering, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
  • Park S; Pohang University of Science and Technology (POSTECH), Medical Device Innovation Center, Department of Electrical Engineering, Convergence IT Engineering, Mechanical Engineering, Medical Science and Engineering, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
  • Kim J; Pohang University of Science and Technology (POSTECH), Medical Device Innovation Center, Department of Electrical Engineering, Convergence IT Engineering, Mechanical Engineering, Medical Science and Engineering, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
  • Kim H; Pohang University of Science and Technology (POSTECH), Medical Device Innovation Center, Department of Electrical Engineering, Convergence IT Engineering, Mechanical Engineering, Medical Science and Engineering, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
  • Cho S; Pohang University of Science and Technology (POSTECH), Medical Device Innovation Center, Department of Electrical Engineering, Convergence IT Engineering, Mechanical Engineering, Medical Science and Engineering, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
  • Kim S; Pohang Accelerator Laboratory, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
  • Park J; Pohang Accelerator Laboratory, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
  • Kim C; Pohang University of Science and Technology (POSTECH), Medical Device Innovation Center, Department of Electrical Engineering, Convergence IT Engineering, Mechanical Engineering, Medical Science and Engineering, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
Photoacoustics ; 35: 100587, 2024 Feb.
Article in En | MEDLINE | ID: mdl-38312809
ABSTRACT
The X-ray free-electron laser (XFEL) has remarkably advanced X-ray imaging technology and enabled important scientific achievements. The XFEL's extremely high power, short pulse width, low emittance, and high coherence make possible such diverse imaging techniques as absorption/emission spectroscopy, diffraction imaging, and scattering imaging. Here, we demonstrate a novel XFEL-based imaging modality that uses the X-ray induced acoustic (XA) effect, which we call X-ray free-electron laser induced acoustic microscopy (XFELAM). Initially, we verified the XA effect by detecting XA signals from various materials, then we validated the experimental results with simulation outcomes. Next, in resolution experiments, we successfully imaged a patterned tungsten target with drilled various-sized circles at a spatial resolution of 7.8 ± 5.1 µm, which is the first micron-scale resolution achieved by XA imaging. Our results suggest that the novel XFELAM can expand the usability of XFEL in various areas of fundamental scientific research.
Key words

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Photoacoustics Year: 2024 Document type: Article Country of publication: Germany

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Photoacoustics Year: 2024 Document type: Article Country of publication: Germany