Precision Measurement of Electroweak Effects in e+e---> micro+ micro- at sqrt s =29 GeV.

Ash WW; Band HR; Blume HT; Camporesi T; Chadwick GB; Clearwater SH; Coombes RW; Delfino MC; Fernandez E; Ford WT; Gettner MW; Goderre GP; Groom DE; Heltsley BK; Hurst RB; Johnson JR; Lau KH; Lavine TL; Leedy RE; Lippi I; Maruyama T; Messner RL; Moromisato JH; Moss LJ; Muller F; Nelson HN; Peruzzi I; Piccolo M; Prepost R; Qi N; Read AL; Ritson DM; Rosenberg LJ; Shambroom WD; Sleeman JC; Smith JG; Venuti JP; von Goeler E; Wald HB; Weinstein R; Wiser DE; Zdarko RW

Ash WW; Band HR; Blume HT; Camporesi T; Chadwick GB; Clearwater SH; Coombes RW; Delfino MC; Fernandez E; Ford WT; Gettner MW; Goderre GP; Groom DE; Heltsley BK; Hurst RB; Johnson JR; Lau KH; Lavine TL; Leedy RE; Lippi I; Maruyama T; Messner RL; Moromisato JH; Moss LJ; Muller F; Nelson HN; Peruzzi I; Piccolo M; Prepost R; Qi N; Read AL; Ritson DM; Rosenberg LJ; Shambroom WD; Sleeman JC; Smith JG; Venuti JP; von Goeler E; Wald HB; Weinstein R; Wiser DE; Zdarko RW.

Phys Rev Lett ; 55(18): 1831-1834, 1985 Oct 28.

Article en En | MEDLINE | ID: mdl-10031938

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Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 1985 Tipo del documento: Article Pais de publicación: EEUU / ESTADOS UNIDOS / ESTADOS UNIDOS DA AMERICA / EUA / UNITED STATES / UNITED STATES OF AMERICA / US / USA

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