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A model for phase noise generation in amplifiers.
Tomlin, T D; Fynn, K; Cantoni, A.
Afiliación
  • Tomlin TD; Department of Electrical and Electronic Engineering, University of Western Australia, Nedlands. ttomlin@bigfoot.com
Article en En | MEDLINE | ID: mdl-11800117
In this paper, a model is presented for predicting the phase modulation (PM) and amplitude modulation (AM) noise in bipolar junction transistor (BJT) amplifiers. The model correctly predicts the dependence of phase noise on the signal frequency (at a particular carrier offset frequency), explains the noise shaping of the phase noise about the signal frequency, and shows the functional dependence on the transistor parameters and the circuit parameters. Experimental studies on common emitter (CE) amplifiers have been used to validate the PM noise model at carrier frequencies between 10 and 100 MHz.
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Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: IEEE Trans Ultrason Ferroelectr Freq Control Asunto de la revista: MEDICINA NUCLEAR Año: 2001 Tipo del documento: Article Pais de publicación: Estados Unidos
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Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: IEEE Trans Ultrason Ferroelectr Freq Control Asunto de la revista: MEDICINA NUCLEAR Año: 2001 Tipo del documento: Article Pais de publicación: Estados Unidos