A model for phase noise generation in amplifiers.
IEEE Trans Ultrason Ferroelectr Freq Control
; 48(6): 1547-54, 2001 Nov.
Article
en En
| MEDLINE
| ID: mdl-11800117
In this paper, a model is presented for predicting the phase modulation (PM) and amplitude modulation (AM) noise in bipolar junction transistor (BJT) amplifiers. The model correctly predicts the dependence of phase noise on the signal frequency (at a particular carrier offset frequency), explains the noise shaping of the phase noise about the signal frequency, and shows the functional dependence on the transistor parameters and the circuit parameters. Experimental studies on common emitter (CE) amplifiers have been used to validate the PM noise model at carrier frequencies between 10 and 100 MHz.
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Colección:
01-internacional
Base de datos:
MEDLINE
Tipo de estudio:
Prognostic_studies
Idioma:
En
Revista:
IEEE Trans Ultrason Ferroelectr Freq Control
Asunto de la revista:
MEDICINA NUCLEAR
Año:
2001
Tipo del documento:
Article
Pais de publicación:
Estados Unidos