Your browser doesn't support javascript.
loading
Benchmarking of electro-optic monitors for femtosecond electron bunches.
Berden, G; Gillespie, W A; Jamison, S P; Knabbe, E-A; MacLeod, A M; van der Meer, A F G; Phillips, P J; Schlarb, H; Schmidt, B; Schmüser, P; Steffen, B.
Afiliación
  • Berden G; FOM Institute for Plasma Physics Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands.
Phys Rev Lett ; 99(16): 164801, 2007 Oct 19.
Article en En | MEDLINE | ID: mdl-17995259
ABSTRACT
The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
Buscar en Google
Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2007 Tipo del documento: Article País de afiliación: Países Bajos
Buscar en Google
Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2007 Tipo del documento: Article País de afiliación: Países Bajos
...