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Single-shot time-resolved measurements of nanosecond-scale spin-transfer induced switching: stochastic versus deterministic aspects.
Devolder, T; Hayakawa, J; Ito, K; Takahashi, H; Ikeda, S; Crozat, P; Zerounian, N; Kim, Joo-Von; Chappert, C; Ohno, H.
Afiliación
  • Devolder T; Institut d'Electronique Fondamentale, CNRS UMR 8622, Bât. 220, université Paris-Sud, 91405 Orsay, France.
Phys Rev Lett ; 100(5): 057206, 2008 Feb 08.
Article en En | MEDLINE | ID: mdl-18352422
ABSTRACT
Using high bandwidth resistance measurements, we study the single-shot response of tunnel junctions subjected to spin torque pulses. After the pulse onset, the switching proceeds by a ns-scale incubation delay during which the resistance is quiet, followed by a 400 ps transition terminated by a large ringing that is damped progressively. While the incubation delay fluctuates significantly, the resistance traces are reproducible once this delay is passed. After switching, the time-resolved resistance traces indicate micromagnetic configurations that are rather spatially coherent.
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Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2008 Tipo del documento: Article País de afiliación: Francia
Buscar en Google
Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2008 Tipo del documento: Article País de afiliación: Francia