Quantitative fitting of nonlinear current-voltage curves and parameter retrieval of semiconducting nanowire, nanotube and nanoribbon devices.
J Nanosci Nanotechnol
; 8(1): 252-8, 2008 Jan.
Article
en En
| MEDLINE
| ID: mdl-18468068
ABSTRACT
A quantitative metal-semiconductor-metal (MSM) model and a Matlab based program have been developed and used to obtain parameters that are important for characterizing semiconductor nanowires (NWs), nanotubes (NTs) or nanoribbons (NRs). The use of the MSM model for quantitative analysis of nonlinear current-voltage curves of one-dimensional semiconducting nanostructures is illustrated by working through two examples, i.e., an amorphous carbon NT and a ZnO NW, and the obtained parameters include the carrier density, mobility, resistance of the NT(NW), and the heights of the two Schottky barriers formed at the interfaces between metal electrodes and semiconducting NT(NW).
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01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
J Nanosci Nanotechnol
Año:
2008
Tipo del documento:
Article
País de afiliación:
China