Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements.
Opt Lett
; 36(17): 3386-8, 2011 Sep 01.
Article
en En
| MEDLINE
| ID: mdl-21886219
ABSTRACT
We characterize the phase shift induced by reflection on a multilayer mirror in the extreme UV range (80-93 eV) using two techniques one based on high order harmonic generation and attosecond metrology (reconstruction of attosecond beating by interference of two-photon transitions), and a second based on synchrotron radiation and measurements of standing waves (total electron yield). We find an excellent agreement between the results from the two measurements and a flat group delay shift (±40 as) over the main reflectivity peak of the mirror.
Texto completo:
1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Opt Lett
Año:
2011
Tipo del documento:
Article
País de afiliación:
Países Bajos