Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips.
Rev Sci Instrum
; 83(3): 036108, 2012 Mar.
Article
en En
| MEDLINE
| ID: mdl-22462974
ABSTRACT
A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM.
Texto completo:
1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Rev Sci Instrum
Año:
2012
Tipo del documento:
Article
País de afiliación:
Canadá