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Errors and their mitigation at the kirchhoff-law-johnson-noise secure key exchange.
Saez, Yessica; Kish, Laszlo B.
Afiliación
  • Saez Y; Department of Electrical and Computer Engineering, Texas A&M University, College Station, Texas, United States of America.
PLoS One ; 8(11): e81103, 2013.
Article en En | MEDLINE | ID: mdl-24303033
ABSTRACT
A method to quantify the error probability at the Kirchhoff-law-Johnson-noise (KLJN) secure key exchange is introduced. The types of errors due to statistical inaccuracies in noise voltage measurements are classified and the error probability is calculated. The most interesting finding is that the error probability decays exponentially with the duration of the time window of single bit exchange. The results indicate that it is feasible to have so small error probabilities of the exchanged bits that error correction algorithms are not required. The results are demonstrated with practical considerations.
Asunto(s)

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Seguridad Computacional / Modelos Teóricos Tipo de estudio: Prognostic_studies Límite: Humans Idioma: En Revista: PLoS One Asunto de la revista: CIENCIA / MEDICINA Año: 2013 Tipo del documento: Article País de afiliación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Seguridad Computacional / Modelos Teóricos Tipo de estudio: Prognostic_studies Límite: Humans Idioma: En Revista: PLoS One Asunto de la revista: CIENCIA / MEDICINA Año: 2013 Tipo del documento: Article País de afiliación: Estados Unidos