Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip.

Houdellier, F; de Knoop, L; Gatel, C; Masseboeuf, A; Mamishin, S; Taniguchi, Y; Delmas, M; Monthioux, M; Hÿtch, M J; Snoeck, E

Houdellier, F; de Knoop, L; Gatel, C; Masseboeuf, A; Mamishin, S; Taniguchi, Y; Delmas, M; Monthioux, M; Hÿtch, M J; Snoeck, E.

Afiliación

Houdellier F; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France.
de Knoop L; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France.
Gatel C; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France.
Masseboeuf A; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France.
Mamishin S; Hitachi High-Technologies Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
Taniguchi Y; Hitachi High-Technologies Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
Delmas M; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France.
Monthioux M; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France.
Hÿtch MJ; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France.
Snoeck E; CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France.

Ultramicroscopy ; 151: 107-115, 2015 Apr.

Article en En | MEDLINE | ID: mdl-25522868

Palabras clave

Carbon tips; Electron holography; Electrons sources; Field emission

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2015 Tipo del documento: Article País de afiliación: Francia Pais de publicación: Países Bajos

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