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The Dark Side of EDX Tomography: Modeling Detector Shadowing to Aid 3D Elemental Signal Analysis.
Yeoh, Catriona S M; Rossouw, David; Saghi, Zineb; Burdet, Pierre; Leary, Rowan K; Midgley, Paul A.
Afiliación
  • Yeoh CS; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
  • Rossouw D; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
  • Saghi Z; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
  • Burdet P; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
  • Leary RK; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
  • Midgley PA; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
Microsc Microanal ; 21(3): 759-64, 2015 Jun.
Article en En | MEDLINE | ID: mdl-25790959
ABSTRACT
A simple model is proposed to account for the loss of collected X-ray signal by the shadowing of X-ray detectors in the scanning transmission electron microscope. The model is intended to aid the analysis of three-dimensional elemental data sets acquired using energy-dispersive X-ray tomography methods where shadow-free specimen holders are unsuitable or unavailable. The model also provides a useful measure of the detection system geometry.
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2015 Tipo del documento: Article País de afiliación: Reino Unido

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2015 Tipo del documento: Article País de afiliación: Reino Unido