Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope.
Rev Sci Instrum
; 86(6): 063703, 2015 Jun.
Article
en En
| MEDLINE
| ID: mdl-26133840
ABSTRACT
In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner's fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α3ß3 subcomplex of F1-ATPase in dynamic action at â¼7 frames/s.
Texto completo:
1
Colección:
01-internacional
Base de datos:
MEDLINE
Asunto principal:
Microscopía de Fuerza Atómica
Idioma:
En
Revista:
Rev Sci Instrum
Año:
2015
Tipo del documento:
Article
País de afiliación:
Japón