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Large volume serial section tomography by Xe Plasma FIB dual beam microscopy.
Burnett, T L; Kelley, R; Winiarski, B; Contreras, L; Daly, M; Gholinia, A; Burke, M G; Withers, P J.
Afiliación
  • Burnett TL; School of Materials, University of Manchester, Manchester M13 9PL, UK; FEI Company, Achtseweg Noord 5, Bldg, 5651 GG, Eindhoven, The Netherlands.
  • Kelley R; FEI Company, 5350 NE Dawson Creek Drive, Hillsboro, OR 97124, United States.
  • Winiarski B; School of Materials, University of Manchester, Manchester M13 9PL, UK; FEI Company, Achtseweg Noord 5, Bldg, 5651 GG, Eindhoven, The Netherlands.
  • Contreras L; FEI Company, 5350 NE Dawson Creek Drive, Hillsboro, OR 97124, United States.
  • Daly M; School of Materials, University of Manchester, Manchester M13 9PL, UK.
  • Gholinia A; School of Materials, University of Manchester, Manchester M13 9PL, UK.
  • Burke MG; School of Materials, University of Manchester, Manchester M13 9PL, UK.
  • Withers PJ; School of Materials, University of Manchester, Manchester M13 9PL, UK; BP International Centre for Advanced Materials, University of Manchester, Manchester M13 9PL, UK. Electronic address: P.J.Withers@manchester.ac.uk.
Ultramicroscopy ; 161: 119-129, 2016 Feb.
Article en En | MEDLINE | ID: mdl-26683814
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2016 Tipo del documento: Article País de afiliación: Países Bajos Pais de publicación: Países Bajos
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2016 Tipo del documento: Article País de afiliación: Países Bajos Pais de publicación: Países Bajos