Application of X-ray micro-CT for micro-structural characterization of APCVD deposited SiC coatings on graphite conduit.

Agrawal, A K; Sarkar, P S; Singh, B; Kashyap, Y S; Rao, P T; Sinha, A

Agrawal, A K; Sarkar, P S; Singh, B; Kashyap, Y S; Rao, P T; Sinha, A.

Afiliación

Agrawal AK; Neutron and X-ray Physics Division, Bhabha Atomic Research Centre, Mumbai, India. Electronic address: ashishka@rrcat.gov.in.
Sarkar PS; Neutron and X-ray Physics Division, Bhabha Atomic Research Centre, Mumbai, India.
Singh B; Neutron and X-ray Physics Division, Bhabha Atomic Research Centre, Mumbai, India.
Kashyap YS; Neutron and X-ray Physics Division, Bhabha Atomic Research Centre, Mumbai, India.
Rao PT; Powder Metallurgy Division, Bhabha Atomic Research Centre, Mumbai, India.
Sinha A; Neutron and X-ray Physics Division, Bhabha Atomic Research Centre, Mumbai, India.

Appl Radiat Isot ; 108: 133-142, 2016 Feb.

Article en En | MEDLINE | ID: mdl-26722834

Palabras clave

Image analysis; Micro-tomography; Microstructure; SiC coating; X-ray imaging

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Appl Radiat Isot Asunto de la revista: MEDICINA NUCLEAR / SAUDE AMBIENTAL Año: 2016 Tipo del documento: Article Pais de publicación: Reino Unido

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