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Nanomaterial datasets to advance tomography in scanning transmission electron microscopy.
Levin, Barnaby D A; Padgett, Elliot; Chen, Chien-Chun; Scott, M C; Xu, Rui; Theis, Wolfgang; Jiang, Yi; Yang, Yongsoo; Ophus, Colin; Zhang, Haitao; Ha, Don-Hyung; Wang, Deli; Yu, Yingchao; Abruña, Hector D; Robinson, Richard D; Ercius, Peter; Kourkoutis, Lena F; Miao, Jianwei; Muller, David A; Hovden, Robert.
Afiliación
  • Levin BD; School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA.
  • Padgett E; School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA.
  • Chen CC; Department of Physics &Astronomy, and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
  • Scott MC; Department of Physics, National Sun Yat-Sen University, Kaohsiung 80424, Taiwan.
  • Xu R; Department of Physics &Astronomy, and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
  • Theis W; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
  • Jiang Y; Department of Physics &Astronomy, and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
  • Yang Y; Nanoscale Physics Research Laboratory, School of Physics and Astronomy, University of Birmingham, Edgbaston, Birmingham B15 2TT, UK.
  • Ophus C; Department of Physics, Cornell University, Ithaca, New York 14853, USA.
  • Zhang H; Department of Physics &Astronomy, and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
  • Ha DH; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
  • Wang D; Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA.
  • Yu Y; Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA.
  • Abruña HD; Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, USA.
  • Robinson RD; School of Chemistry and Chemical Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
  • Ercius P; Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, USA.
  • Kourkoutis LF; Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, USA.
  • Miao J; Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA.
  • Muller DA; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
  • Hovden R; School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA.
Sci Data ; 3: 160041, 2016 06 07.
Article en En | MEDLINE | ID: mdl-27272459
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Microscopía Electrónica de Transmisión de Rastreo / Tomografía con Microscopio Electrónico Idioma: En Revista: Sci Data Año: 2016 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido
Texto completo
Añadir a Mi BVS
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XML
PubMed Links
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Microscopía Electrónica de Transmisión de Rastreo / Tomografía con Microscopio Electrónico Idioma: En Revista: Sci Data Año: 2016 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido