Measurement and Modeling of Short and Medium Range Order in Amorphous Ta2O5 Thin Films.

Shyam, Badri; Stone, Kevin H; Bassiri, Riccardo; Fejer, Martin M; Toney, Michael F; Mehta, Apurva

Shyam, Badri; Stone, Kevin H; Bassiri, Riccardo; Fejer, Martin M; Toney, Michael F; Mehta, Apurva.

Afiliación

Shyam B; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park CA 94025, United States.
Stone KH; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park CA 94025, United States.
Bassiri R; E. L. Ginzton Laboratory, Stanford University, Stanford CA 94305, United States.
Fejer MM; E. L. Ginzton Laboratory, Stanford University, Stanford CA 94305, United States.
Toney MF; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park CA 94025, United States.
Mehta A; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park CA 94025, United States.

Sci Rep ; 6: 32170, 2016 08 26.

Article en En | MEDLINE | ID: mdl-27562542

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2016 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido

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