Use of XPS to Quantify Thickness of Coatings on Nanoparticles.

Baer, Donald R; Wang, Yung-Cheng; Castner, David G

Baer, Donald R; Wang, Yung-Cheng; Castner, David G.

Afiliación

Baer DR; Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA 99352.
Wang YC; National ESCA & Surface Analysis Center for Biomedical Problems, Department of Bioengineering, Box 351653, University of Washington, Seattle, WA 98195-1653 USA.
Castner DG; National ESCA & Surface Analysis Center for Biomedical Problems, Department of Bioengineering, Box 351653, University of Washington, Seattle, WA 98195-1653 USA; National ESCA & Surface Analysis Center for Biomedical Problems, Department of Chemical Engineering, Box 351653, University of Washington, Seattle, WA 98195-1653 USA.

Micros Today ; 24(2): 40-45, 2016 Mar.

Article en En | MEDLINE | ID: mdl-27574498

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Micros Today Año: 2016 Tipo del documento: Article Pais de publicación: Estados Unidos

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