Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy.

Bangert, U; Stewart, A; O'Connell, E; Courtney, E; Ramasse, Q; Kepaptsoglou, D; Hofsäss, H; Amani, J; Tu, J-S; Kardynal, B

Bangert, U; Stewart, A; O'Connell, E; Courtney, E; Ramasse, Q; Kepaptsoglou, D; Hofsäss, H; Amani, J; Tu, J-S; Kardynal, B.

Afiliación

Bangert U; Department of Physics, School of Sciences & Bernal Institute, University of Limerick, Limerick, Ireland. Electronic address: Ursel.Bangert@ul.ie.
Stewart A; Department of Physics, School of Sciences & Bernal Institute, University of Limerick, Limerick, Ireland.
O'Connell E; Department of Physics, School of Sciences & Bernal Institute, University of Limerick, Limerick, Ireland.
Courtney E; Department of Physics, School of Sciences & Bernal Institute, University of Limerick, Limerick, Ireland.
Ramasse Q; SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury WA4 4AD, United Kingdom.
Kepaptsoglou D; SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury WA4 4AD, United Kingdom.
Hofsäss H; II. Physikalisches Institut, Georg-August-Universität Göttingen, Friedrich-Hund-PLatz 1, 37077 Göttingen, Germany.
Amani J; II. Physikalisches Institut, Georg-August-Universität Göttingen, Friedrich-Hund-PLatz 1, 37077 Göttingen, Germany.
Tu JS; Peter Grünberg Institut 9, Forschungszentrum Jülich, 52425 Jülich, Germany.
Kardynal B; Peter Grünberg Institut 9, Forschungszentrum Jülich, 52425 Jülich, Germany.

Ultramicroscopy ; 176: 31-36, 2017 05.

Article en En | MEDLINE | ID: mdl-28012570

Palabras clave

2-D materials; HAADF STEM imaging; Ion implantation; MoS(2); Z-contrast

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2017 Tipo del documento: Article Pais de publicación: Países Bajos

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