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Leaching of Conductive Species: Implications to Measurements of Electrical Resistivity.
Spragg, R; Jones, S; Bu, Y; Lu, Y; Bentz, D; Snyder, K; Weiss, J.
Afiliación
  • Spragg R; Purdue University, West Lafayette, IN.
  • Jones S; Oregon State University, Corvallis, OR.
  • Bu Y; National Institute of Standards and Technology, Gaithersburg, MD.
  • Lu Y; Twining, Inc., San Diego, CA.
  • Bentz D; Boise State University, Boise, ID.
  • Snyder K; National Institute of Standards and Technology, Gaithersburg, MD.
  • Weiss J; National Institute of Standards and Technology, Gaithersburg, MD.
Cem Concr Compos ; 79: 94-105, 2017 May.
Article en En | MEDLINE | ID: mdl-28584407

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Cem Concr Compos Año: 2017 Tipo del documento: Article País de afiliación: India

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Cem Concr Compos Año: 2017 Tipo del documento: Article País de afiliación: India