Interfacial Chemistry-Induced Modulation of Schottky Barrier Heights: In Situ Measurements of the Pt-Amorphous Indium Gallium Zinc Oxide Interface Using X-ray Photoelectron Spectroscopy.

Flynn, Brendan T; Oleksak, Richard P; Thevuthasan, Suntharampillai; Herman, Gregory S

Flynn, Brendan T; Oleksak, Richard P; Thevuthasan, Suntharampillai; Herman, Gregory S.

Afiliación

Flynn BT; School of Chemical, Biological and Environmental Engineering, Oregon State University , Corvallis, Oregon 97331, United States.
Oleksak RP; School of Chemical, Biological and Environmental Engineering, Oregon State University , Corvallis, Oregon 97331, United States.
Thevuthasan S; Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory , Richland, Washington 99352, United States.
Herman GS; School of Chemical, Biological and Environmental Engineering, Oregon State University , Corvallis, Oregon 97331, United States.

ACS Appl Mater Interfaces ; 10(4): 4333-4340, 2018 Jan 31.

Article en En | MEDLINE | ID: mdl-29313332

Palabras clave

IGZO; RRAM; Schottky barrier; X-ray photoelectron spectroscopy; diode

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2018 Tipo del documento: Article País de afiliación: Estados Unidos

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