Quantification of crystallinity using zero-loss filtered electron diffraction.

An, Byeong-Seon; Kwon, Yena; Cha, Hyun-Woo; Kang, Min-Chul; Oh, Jin-Su; Yang, Cheol-Woong

An, Byeong-Seon; Kwon, Yena; Cha, Hyun-Woo; Kang, Min-Chul; Oh, Jin-Su; Yang, Cheol-Woong.

Afiliación

An BS; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 16419, Korea.
Kwon Y; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 16419, Korea.
Cha HW; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 16419, Korea.
Kang MC; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 16419, Korea.
Oh JS; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 16419, Korea.
Yang CW; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 16419, Korea.

Microsc Res Tech ; 82(1): 39-46, 2019 Jan.

Article en En | MEDLINE | ID: mdl-30295355

Palabras clave

crystallinity; energy-filtered transmission electron microscopy; selected area electron diffraction

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Res Tech Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2019 Tipo del documento: Article Pais de publicación: Estados Unidos

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