Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy.

Van Aert, Sandra; De Backer, Annick; Jones, Lewys; Martinez, Gerardo T; Béché, Armand; Nellist, Peter D

Van Aert, Sandra; De Backer, Annick; Jones, Lewys; Martinez, Gerardo T; Béché, Armand; Nellist, Peter D.

Afiliación

Van Aert S; EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
De Backer A; EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Jones L; Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, United Kingdom.
Martinez GT; Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin 2, Ireland.
Béché A; School of Physics, Trinity College Dublin, The University of Dublin, Dublin 2, Ireland.
Nellist PD; EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

Phys Rev Lett ; 122(6): 066101, 2019 Feb 15.

Article en En | MEDLINE | ID: mdl-30822049

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Phys Rev Lett Año: 2019 Tipo del documento: Article País de afiliación: Bélgica

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