Error-Disturbance Trade-off in Sequential Quantum Measurements.

Mao, Ya-Li; Ma, Zhi-Hao; Jin, Rui-Bo; Sun, Qi-Chao; Fei, Shao-Ming; Zhang, Qiang; Fan, Jingyun; Pan, Jian-Wei

Mao, Ya-Li; Ma, Zhi-Hao; Jin, Rui-Bo; Sun, Qi-Chao; Fei, Shao-Ming; Zhang, Qiang; Fan, Jingyun; Pan, Jian-Wei.

Afiliación

Mao YL; Department of Modern Physics and National Laboratory for Physical Sciences at Microscale, Shanghai Branch, University of Science and Technology of China, Hefei, Anhui 230026, China.
Ma ZH; CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics, Shanghai Branch, University of Science and Technology of China, Hefei, Anhui 230026, China.
Jin RB; School of Mathematical Sciences, Shanghai Jiao Tong University, Shanghai 200240, China.
Sun QC; Hubei Key Laboratory of Optical Information and Pattern Recognition, Wuhan Institute of Technology, Wuhan 430205, China.
Fei SM; Department of Modern Physics and National Laboratory for Physical Sciences at Microscale, Shanghai Branch, University of Science and Technology of China, Hefei, Anhui 230026, China.
Zhang Q; CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics, Shanghai Branch, University of Science and Technology of China, Hefei, Anhui 230026, China.
Fan J; School of Mathematical Sciences, Capital Normal University, Beijing 100048, China.
Pan JW; Max-Planck-Institute for Mathematics in the Sciences, 04103 Leipzig, Germany.

Phys Rev Lett ; 122(9): 090404, 2019 Mar 08.

Article en En | MEDLINE | ID: mdl-30932520

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2019 Tipo del documento: Article País de afiliación: China

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