Resolution enhancement in scanning electron microscopy using deep learning.

de Haan, Kevin; Ballard, Zachary S; Rivenson, Yair; Wu, Yichen; Ozcan, Aydogan

de Haan, Kevin; Ballard, Zachary S; Rivenson, Yair; Wu, Yichen; Ozcan, Aydogan.

Afiliación

de Haan K; Electrical and Computer Engineering Department, University of California, Los Angeles, CA, 90095, USA.
Ballard ZS; Bioengineering Department, University of California, Los Angeles, CA, 90095, USA.
Rivenson Y; California NanoSystems Institute (CNSI), University of California, Los Angeles, CA, 90095, USA.
Wu Y; Electrical and Computer Engineering Department, University of California, Los Angeles, CA, 90095, USA.
Ozcan A; Bioengineering Department, University of California, Los Angeles, CA, 90095, USA.

Sci Rep ; 9(1): 12050, 2019 08 19.

Article en En | MEDLINE | ID: mdl-31427691

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2019 Tipo del documento: Article País de afiliación: Estados Unidos

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