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Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns.
Mousley, Michael; Eswara, Santhana; De Castro, Olivier; Bouton, Olivier; Klingner, Nico; Koch, Christoph T; Hlawacek, Gregor; Wirtz, Tom.
Afiliación
  • Mousley M; Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg.
  • Eswara S; Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg.
  • De Castro O; Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg.
  • Bouton O; Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg.
  • Klingner N; Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf e.V., Bautzner Landstr. 400, 01328 Dresden, Germany.
  • Koch CT; Department of Physics, Humboldt University of Berlin, Newtonstraße 15, 12489 Berlin, Germany.
  • Hlawacek G; Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf e.V., Bautzner Landstr. 400, 01328 Dresden, Germany.
  • Wirtz T; Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg.
Beilstein J Nanotechnol ; 10: 1648-1657, 2019.
Article en En | MEDLINE | ID: mdl-31467826

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Beilstein J Nanotechnol Año: 2019 Tipo del documento: Article País de afiliación: Luxemburgo Pais de publicación: Alemania

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Beilstein J Nanotechnol Año: 2019 Tipo del documento: Article País de afiliación: Luxemburgo Pais de publicación: Alemania