Sn in the Ag-Hg phase of dental amalgam.

In a recent study, Sarkar and Eyer (1986) studied an amalgam which was formed using a unique procedure. Based on their results, they concluded that the solubility of Sn in the Ag-Hg (gamma 1) phase of dental amalgam was virtually nil (less than 0.25 wt%). This finding is contrary to the published results of other investigations. The purpose of the present study was to clarify these disparate findings. A low-copper dental amalgam was examined by electron probe microanalysis. This amalgam was selected because it exhibits unusually large gamma 1 grains (10 microns). Because the influence of the electron-analyzing beam can be completely contained within these large grains, grain boundaries or peripheral phases would not be excited, and a valid analysis of the gamma 1 grains themselves could be made. The analyses showed significant Sn contents of 2.0-3.0 wt%. Analyses of areas which contained grain boundaries showed slight or no differences in Sn content compared with that for the grains alone. Furthermore, secondary electron scans of this dental amalgam failed to reveal the intergranular precipitates of Sn-Hg observed by Sarkar and Eyer (1986) in their amalgam. These different results can be explained by the fact that the unique amalgam investigated by Sarkar and Eyer does not exhibit the same diffusional patterns as does dental amalgam, and that the composition of the gamma 1 in the two amalgams is not the same. The final conclusion is that the Ag-Hg (gamma 1) phase in dental amalgam does indeed contain a significant amount of Sn.