Characterization of the soft X-ray spectrometer PEAXIS at BESSYâ
II.
J Synchrotron Radiat
; 27(Pt 1): 238-249, 2020 Jan 01.
Article
en En
| MEDLINE
| ID: mdl-31868758
The performance of the recently commissioned spectrometer PEAXIS for resonant inelastic soft X-ray scattering (RIXS) and X-ray photoelectron spectroscopy and its hosting beamline U41-PEAXIS at the BESSYâ
II synchrotron are characterized. The beamline provides linearly polarized light from 180â
eV to 1600â
eV allowing for RIXS measurements in the range 200-1200â
eV. The monochromator optics can be operated in different configurations to provide either high flux with up to 1012â
photonsâ
s-1 within the focal spot at the sample or high energy resolution with a full width at half maximum of <40â
meV at an incident photon energy of â¼400â
eV. The measured total energy resolution of the RIXS spectrometer is in very good agreement with theoretically predicted values obtained by ray-tracing simulations. PEAXIS features a 5â
m-long RIXS spectrometer arm that can be continuously rotated about the sample position by 106° within the horizontal photon scattering plane, thus enabling the study of momentum-transfer-dependent excitations. Selected scientific examples are presented to demonstrate the instrument capabilities, including measurements of excitations in single-crystalline NiO and in liquid acetone employing a fluid cell sample manipulator. Planned upgrades of the beamline and the RIXS spectrometer to further increase the energy resolution to â¼100â
meV at 1000â
eV incident photon energy are discussed.
Texto completo:
1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
J Synchrotron Radiat
Asunto de la revista:
RADIOLOGIA
Año:
2020
Tipo del documento:
Article
País de afiliación:
Alemania
Pais de publicación:
Estados Unidos