Electronic Polarizability as the Fundamental Variable in the Dielectric Properties of Two-Dimensional Materials.

Tian, Tian; Scullion, Declan; Hughes, Dale; Li, Lu Hua; Shih, Chih-Jen; Coleman, Jonathan; Chhowalla, Manish; Santos, Elton J G

Tian, Tian; Scullion, Declan; Hughes, Dale; Li, Lu Hua; Shih, Chih-Jen; Coleman, Jonathan; Chhowalla, Manish; Santos, Elton J G.

Afiliación

Tian T; Institute for Chemical and Bioengineering , ETH Zürich , Vladimir Prelog Weg 1 , CH-8093 Zürich , Switzerland.
Scullion D; School of Mathematics and Physics , Queen's University , Belfast BT7 1NN , United Kingdom.
Hughes D; School of Mathematics and Physics , Queen's University , Belfast BT7 1NN , United Kingdom.
Li LH; Institute for Frontier Materials , Deakin University , Waurn Ponds, Victoria 3216 , Australia.
Shih CJ; Institute for Chemical and Bioengineering , ETH Zürich , Vladimir Prelog Weg 1 , CH-8093 Zürich , Switzerland.
Coleman J; School of Physics, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and Advanced Materials and BioEngineering Research (AMBER) , Trinity College Dublin , Dublin 2, Ireland.
Chhowalla M; Department of Materials Science and Metallurgy , University of Cambridge , Cambridge CB3 0FS , United Kingdom.
Santos EJG; School of Mathematics and Physics , Queen's University , Belfast BT7 1NN , United Kingdom.

Nano Lett ; 20(2): 841-851, 2020 Feb 12.

Article en En | MEDLINE | ID: mdl-31888332

Palabras clave

Dielectric screening; dielectric anisotropy; electronic polarizability; first priciples simulations; scaling relation; two-dimensionalmaterial

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2020 Tipo del documento: Article País de afiliación: Suiza Pais de publicación: Estados Unidos

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