An Effective Simulation Analysis of Transient Electromagnetic Multiple Faults.

Dong, Liang; Zhang, Hongxin; Sun, Shaofei; Zhu, Lei; Cui, Xiaotong; Ghosh, Bablu K

Dong, Liang; Zhang, Hongxin; Sun, Shaofei; Zhu, Lei; Cui, Xiaotong; Ghosh, Bablu K.

Afiliación

Dong L; School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China.
Zhang H; Communication and Electronic Engineering Institute, Qiqihar University, Qiqihar 161006, China.
Sun S; School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China.
Zhu L; School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China.
Cui X; Communication and Electronic Engineering Institute, Qiqihar University, Qiqihar 161006, China.
Ghosh BK; School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China.

Sensors (Basel) ; 20(7)2020 Apr 01.

Article en En | MEDLINE | ID: mdl-32244774

Palabras clave

Midori; ciphertext-only fault analysis; differential attack; random multiple fault attacks; transient electromagnetic injection

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sensors (Basel) Año: 2020 Tipo del documento: Article País de afiliación: China Pais de publicación: Suiza

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google