Direct-bandgap emission from hexagonal Ge and SiGe alloys.

Fadaly, Elham M T; Dijkstra, Alain; Suckert, Jens Renè; Ziss, Dorian; van Tilburg, Marvin A J; Mao, Chenyang; Ren, Yizhen; van Lange, Victor T; Korzun, Ksenia; Kölling, Sebastian; Verheijen, Marcel A; Busse, David; Rödl, Claudia; Furthmüller, Jürgen; Bechstedt, Friedhelm; Stangl, Julian; Finley, Jonathan J; Botti, Silvana; Haverkort, Jos E M; Bakkers, Erik P A M

Fadaly, Elham M T; Dijkstra, Alain; Suckert, Jens Renè; Ziss, Dorian; van Tilburg, Marvin A J; Mao, Chenyang; Ren, Yizhen; van Lange, Victor T; Korzun, Ksenia; Kölling, Sebastian; Verheijen, Marcel A; Busse, David; Rödl, Claudia; Furthmüller, Jürgen; Bechstedt, Friedhelm; Stangl, Julian; Finley, Jonathan J; Botti, Silvana; Haverkort, Jos E M; Bakkers, Erik P A M.

Afiliación

Fadaly EMT; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
Dijkstra A; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
Suckert JR; Institut für Festkörpertheorie und -optik, Friedrich-Schiller-Universität Jena, Jena, Germany.
Ziss D; Institute of Semiconductor and Solid-State Physics, Johannes Kepler University, Linz, Austria.
van Tilburg MAJ; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
Mao C; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
Ren Y; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
van Lange VT; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
Korzun K; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
Kölling S; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
Verheijen MA; Department of Engineering Physics, École Polytechnique de Montréal, Montreal, Québec, Canada.
Busse D; Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
Rödl C; Eurofins Materials Science Netherlands, Eindhoven, The Netherlands.
Furthmüller J; Physik Department & Walter-Schottky-Institut, Technische Universität München, Garching, Germany.
Bechstedt F; Institut für Festkörpertheorie und -optik, Friedrich-Schiller-Universität Jena, Jena, Germany.
Stangl J; Institut für Festkörpertheorie und -optik, Friedrich-Schiller-Universität Jena, Jena, Germany.
Finley JJ; Institut für Festkörpertheorie und -optik, Friedrich-Schiller-Universität Jena, Jena, Germany.
Botti S; Institute of Semiconductor and Solid-State Physics, Johannes Kepler University, Linz, Austria.
Haverkort JEM; Physik Department & Walter-Schottky-Institut, Technische Universität München, Garching, Germany.
Bakkers EPAM; Institut für Festkörpertheorie und -optik, Friedrich-Schiller-Universität Jena, Jena, Germany.

Nature ; 580(7802): 205-209, 2020 04.

Article en En | MEDLINE | ID: mdl-32269353

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nature Año: 2020 Tipo del documento: Article País de afiliación: Países Bajos Pais de publicación: Reino Unido

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