Robust Optical-Levitation-Based Metrology of Nanoparticle's Position and Mass.

Zheng, Yu; Zhou, Lei-Ming; Dong, Yang; Qiu, Cheng-Wei; Chen, Xiang-Dong; Guo, Guang-Can; Sun, Fang-Wen

Zheng, Yu; Zhou, Lei-Ming; Dong, Yang; Qiu, Cheng-Wei; Chen, Xiang-Dong; Guo, Guang-Can; Sun, Fang-Wen.

Afiliación

Zheng Y; CAS Key Lab of Quantum Information, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
Zhou LM; CAS Center For Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
Dong Y; Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117583, Singapore.
Qiu CW; CAS Key Lab of Quantum Information, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
Chen XD; CAS Center For Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
Guo GC; Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117583, Singapore.
Sun FW; CAS Key Lab of Quantum Information, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.

Phys Rev Lett ; 124(22): 223603, 2020 Jun 05.

Article en En | MEDLINE | ID: mdl-32567927

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2020 Tipo del documento: Article Pais de publicación: Estados Unidos

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