Contactless Measurements of Carrier Concentrations in InGaAs Layers for Utilizing in InP-Based Quantum Cascade Lasers by Employing Optical Spectroscopy.

Kurka, Marcin; Rygala, Michal; Sek, Grzegorz; Gutowski, Piotr; Pierscinski, Kamil; Motyka, Marcin

Kurka, Marcin; Rygala, Michal; Sek, Grzegorz; Gutowski, Piotr; Pierscinski, Kamil; Motyka, Marcin.

Afiliación

Kurka M; Laboratory for Optical Spectroscopy of Nanostructures, Department of Experimental Physics, Wroclaw University of Science and Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland.
Rygala M; Laboratory for Optical Spectroscopy of Nanostructures, Department of Experimental Physics, Wroclaw University of Science and Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland.
Sek G; Laboratory for Optical Spectroscopy of Nanostructures, Department of Experimental Physics, Wroclaw University of Science and Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland.
Gutowski P; Lukasiewicz Research Network-Institute of Electron Technology, Al. Lotników 32/48, 02-668 Warszawa, Poland.
Pierscinski K; Lukasiewicz Research Network-Institute of Electron Technology, Al. Lotników 32/48, 02-668 Warszawa, Poland.
Motyka M; Laboratory for Optical Spectroscopy of Nanostructures, Department of Experimental Physics, Wroclaw University of Science and Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland.

Materials (Basel) ; 13(14)2020 Jul 12.

Article en En | MEDLINE | ID: mdl-32664660

Palabras clave

Berreman effect; carrier concentration; gas sensing; mid-infrared; quantum cascade lasers

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2020 Tipo del documento: Article País de afiliación: Polonia Pais de publicación: Suiza

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