Machine Learning for Seed Quality Classification: An Advanced Approach Using Merger Data from FT-NIR Spectroscopy and X-ray Imaging.

ABSTRACT

Optical sensors combined with machine learning algorithms have led to significant advances in seed science. These advances have facilitated the development of robust approaches, providing decision-making support in the seed industry related to the marketing of seed lots. In this study, a novel approach for seed quality classification is presented. We developed classifier models using Fourier transform near-infrared (FT-NIR) spectroscopy and X-ray imaging techniques to predict seed germination and vigor. A forage grass (Urochloa brizantha) was used as a model species. FT-NIR spectroscopy data and radiographic images were obtained from individual seeds, and the models were created based on the following algorithms linear discriminant analysis (LDA), partial least squares discriminant analysis (PLS-DA), random forest (RF), naive Bayes (NB), and support vector machine with radial basis (SVM-r) kernel. In the germination prediction, the models individually reached an accuracy of 82% using FT-NIR data, and 90% using X-ray data. For seed vigor, the models achieved 61% and 68% accuracy using FT-NIR and X-ray data, respectively. Combining the FT-NIR and X-ray data, the performance of the classification model reached an accuracy of 85% to predict germination, and 62% for seed vigor. Overall, the models developed using both NIR spectra and X-ray imaging data in machine learning algorithms are efficient in quickly, non-destructively, and accurately identifying the capacity of seed to germinate. The use of X-ray data and the LDA algorithm showed great potential to be used as a viable alternative to assist in the quality classification of U. brizantha seeds.