Facile Morphological Qualification of Transferred Graphene by Phase-Shifting Interferometry.

Lee, Ukjae; Woo, Yun Sung; Han, Yoojoong; Gutiérrez, Humberto R; Kim, Un Jeong; Son, Hyungbin

Lee, Ukjae; Woo, Yun Sung; Han, Yoojoong; Gutiérrez, Humberto R; Kim, Un Jeong; Son, Hyungbin.

Afiliación

Lee U; School of Integrative Engineering, Chung-Ang University, Seoul, 06974, Republic of Korea.
Woo YS; Department of Materials Science and Engineering, Dankook University, Cheonan, 31116, Republic of Korea.
Han Y; School of Integrative Engineering, Chung-Ang University, Seoul, 06974, Republic of Korea.
Gutiérrez HR; Nano Technology Division, NANOBASE Inc., Seoul, 08502, Republic of Korea.
Kim UJ; Department of Physics, University of South Florida, Tampa, FL, 33620, USA.
Son H; Imaging Device Laboratory, Samsung Advanced Institute of Technology, Suwon, Gyeonggi-do, 16419, Republic of Korea.

Adv Mater ; 32(38): e2002854, 2020 Sep.

Article en En | MEDLINE | ID: mdl-32797695

Palabras clave

chemical vapor deposition; graphene; phase-shifting interferometry; residues; transfer

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Adv Mater Asunto de la revista: BIOFISICA / QUIMICA Año: 2020 Tipo del documento: Article Pais de publicación: Alemania

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