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Defect-Related Broadband Emission in Two-Dimensional Lead Bromide Perovskite Microsheets.
Li, Xianli; Lian, Xin; Pang, Junhong; Luo, Binbin; Xiao, Yonghong; Li, Ming-De; Huang, Xiao-Chun; Zhang, Jin Zhong.
Afiliación
  • Li X; Department of Chemistry and Key Laboratory for Preparation and Application of Ordered Structural Materials of Guangdong Province, Shantou University, Shantou, Guangdong 515063, China.
  • Lian X; Department of Chemistry and Key Laboratory for Preparation and Application of Ordered Structural Materials of Guangdong Province, Shantou University, Shantou, Guangdong 515063, China.
  • Pang J; Department of Chemistry and Key Laboratory for Preparation and Application of Ordered Structural Materials of Guangdong Province, Shantou University, Shantou, Guangdong 515063, China.
  • Luo B; Department of Chemistry and Key Laboratory for Preparation and Application of Ordered Structural Materials of Guangdong Province, Shantou University, Shantou, Guangdong 515063, China.
  • Xiao Y; Chemistry and Chemical Engineering Guangdong Laboratory, Shantou 515063, China.
  • Li MD; Department of Chemistry and Key Laboratory for Preparation and Application of Ordered Structural Materials of Guangdong Province, Shantou University, Shantou, Guangdong 515063, China.
  • Huang XC; Department of Chemistry and Key Laboratory for Preparation and Application of Ordered Structural Materials of Guangdong Province, Shantou University, Shantou, Guangdong 515063, China.
  • Zhang JZ; Chemistry and Chemical Engineering Guangdong Laboratory, Shantou 515063, China.
J Phys Chem Lett ; 11(19): 8157-8163, 2020 Oct 01.
Article en En | MEDLINE | ID: mdl-32902289

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Phys Chem Lett Año: 2020 Tipo del documento: Article País de afiliación: China Pais de publicación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Phys Chem Lett Año: 2020 Tipo del documento: Article País de afiliación: China Pais de publicación: Estados Unidos