Investigation of Roughness Correlation in Polymer Brushes via X-ray Scattering.

Hildebrandt, Marcus; Shin, Eui-Young; Yang, Suan; Ali, Wael; Altinpinar, Sedakat; Gutmann, Jochen S

Hildebrandt, Marcus; Shin, Eui-Young; Yang, Suan; Ali, Wael; Altinpinar, Sedakat; Gutmann, Jochen S.

Afiliación

Hildebrandt M; Department of Physical Chemistry and Center of Nanointegration (CENIDE), University of Duisburg-Essen, Universitätsstr. 2, 45141 Essen, Germany.
Shin EY; Department of Physical Chemistry and Center of Nanointegration (CENIDE), University of Duisburg-Essen, Universitätsstr. 2, 45141 Essen, Germany.
Yang S; Department of Physical Chemistry and Center of Nanointegration (CENIDE), University of Duisburg-Essen, Universitätsstr. 2, 45141 Essen, Germany.
Ali W; Department of Physical Chemistry and Center of Nanointegration (CENIDE), University of Duisburg-Essen, Universitätsstr. 2, 45141 Essen, Germany.
Altinpinar S; Deutsches Textilforschungszentrum Nord-West gGmbH, Adlerstr. 1, 47798 Krefeld, Germany.
Gutmann JS; Department of Physical Chemistry and Center of Nanointegration (CENIDE), University of Duisburg-Essen, Universitätsstr. 2, 45141 Essen, Germany.

Polymers (Basel) ; 12(9)2020 Sep 15.

Article en En | MEDLINE | ID: mdl-32942755

Palabras clave

X-ray scattering; polymer brushes; polymer thin films; roughness correlation

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Polymers (Basel) Año: 2020 Tipo del documento: Article País de afiliación: Alemania Pais de publicación: Suiza

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